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M² Measurement System |
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| CNI proudly introduces its advanced M² Measurement System, featuring a compact all-in-one design integrated with a high-precision motorized translation stage and a high-resolution beam profiler for capturing laser spot images. This system utilizes Independently developed analysis software to accurately measure critical beam quality parameters, including: M² Factor、Beam Divergence Angle、Focus Diameter、Beam Eaist Position、Rayleigh Length and other essential laser beam characteristics.
Engineered to deliver overall accuracy within ±5%, the system meets rigorous demands for beam quality analysis. It is widely applicable in laser technology, fiber-optic communications, biomedical research, and laser-based manufacturing. The product has short lead times、rapid after-sales support、high cost-effectiveness. It will be an economical and efficient alternative to imported beam quality analyzersand. |
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■ M² Measurement System |
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Application
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Performance Advantages
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■ Specification |
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Model |
CN0310VIS-M2-B |
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Operating Wavelength |
340-1100 nm |
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M² Measurement Range |
1 -50 |
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Max Input Spot Size |
≤5 mm @ 355 nm (1/e²) |
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Measurement Accuracy |
≤5% |
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Focus Position Accuracy |
±10% |
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Pixel Size |
3.2 μm |
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Max Resolution |
2448 × 2448 pixels |
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Laser Power Handling |
CW: 1 μW – 10 W/cm² |
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Bit Depth |
12-bit |
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Attenuator |
OD0.5 / OD1 / OD1.5 / OD2 / OD3 / OD4 |
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Interface |
USB 3.0 |
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Scanning Range |
200 mm travel (Double optical path length) |
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Repositioning Accuracy |
±5 μm |
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Controller |
RS232 interface, dual-axis motorized stage |
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Weight |
<15 kg |
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Dimensions |
500 × 250 × 175 mm (reference design) |
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| Datasheet |  |
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■ Operating Software |
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New launched M² Measurement System with simple structure and easy to use, etc.
2025 06/09
